Enhanced feedback performance in off-resonance AFM modes through pulse train sampling

• Mustafa Kangül,
• Navid Asmari,
• Santiago H. Andany,
• Marcos Penedo and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2024, 15, 134–143, doi:10.3762/bjnano.15.13

• rate and therefore enables higher scan rates while refining the mechanical property mapping. Keywords: atomic force microscopy (AFM); feedback control; off-resonance tapping (ORT); pulsed-force mode; Introduction Constant force mode, a widely used AFM imaging mode, utilizes a feedback controller that

• material properties [17][18][19][20][21][22]. AFM companies included variations of the pulse force mode in their microscopes, such as PeakForce™ Tapping (Bruker), Digital Pulsed Force Mode™ (WITec), HybriD mode (NT-DMT), and WaveMode (Nanosurf). While these implementations have subtle differences, we refer

• been introduced [2][3]. Although these methods are gentler than contact mode, interpreting and controlling the vertical force exerted on the sample is not straightforward. To achieve a better tip–sample force control, Rosa-Zeiser et al. [4] presented an off-resonance dynamic mode called pulsed force

Two dynamic modes to streamline challenging atomic force microscopy measurements

• Alexei G. Temiryazev,
• Andrey V. Krayev and
• Marina P. Temiryazeva

Beilstein J. Nanotechnol. 2021, 12, 1226–1236, doi:10.3762/bjnano.12.90

• interaction of the probe with the sample is used in off-resonance dynamic modes [6]. Although they have various names, depending on the specific manufacturer (PeakForce Tapping, Hybrid Mode, Digital Pulsed Force Mode), a common feature of these methods is that the transition to the contact is carried out

Bulk chemical composition contrast from attractive forces in AFM force spectroscopy

• Dorothee Silbernagl,
• Media Ghasem Zadeh Khorasani,
• Natalia Cano Murillo,
• Anna Maria Elert and
• Heinz Sturm

Beilstein J. Nanotechnol. 2021, 12, 58–71, doi:10.3762/bjnano.12.5

• methods. This has resulted in methods such as force modulation [4], bimodal mode [5], pulsed-force mode [6] or peak force [7], and intermodulation AFM (ImAFM) with amplitude-dependent force spectroscopy (ADFS) [8][9][10]. Dynamic methods record local mechanical properties with a resolution in the range of

Mapping mechanical properties of organic thin films by force-modulation microscopy in aqueous media

• Jianming Zhang,
• Zehra Parlak,
• Carleen M. Bowers,
• Terrence Oas and
• Stefan Zauscher

Beilstein J. Nanotechnol. 2012, 3, 464–474, doi:10.3762/bjnano.3.53

• lateral resolution, is ideally suited to map these properties. Intermittent AFM imaging modes, such as tapping mode [22][23][24], and pulsed-force mode [12][25][26][27][28], have been developed for soft, often biological, samples in liquid environments. Although these imaging modes reduce the lateral

Theoretical study of the frequency shift in bimodal FM-AFM by fractional calculus

• Elena T. Herruzo and
• Ricardo Garcia

Beilstein J. Nanotechnol. 2012, 3, 198–206, doi:10.3762/bjnano.3.22

• the sample properties in a quantitative way [2][3][4][5][6][7][8][9][10][11][12][13][14][15][16]. Both static (contact) [2][3][4][5][6][7] and dynamic [8][9][10][11][14][15][16][17] AFM methods have been applied. Static techniques such as nanoindentation [2], pulsed-force mode [3] and force modulation